ATOMIC FORCE MICROSCOPE Definition & Meaning

atomic force microscope

A microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. The probe is extremely close to—but does not touch—the surface. As the probe traverses the surface, attractive and repulsive forces arising between it and the atoms on the surface induce forces on the probe that bend the cantilever. The amount of bending is measured and recorded, providing a map of the atoms on the surface. Atomic force microscopes can achieve magnification of a factor of 5 × 10 ⁶, with a resolution of 2 angstroms, sufficient to resolve individual carbon atoms.
Also called scanning force microscope

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The atomic force microscope is a suitable tool for scanning surfaces at an atomic level or investigating interactions between molecules such as food constituents and receptor proteins.

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The researchers then measured the actual positions of the holes with an atomic force microscope, ensuring that the positions were traceable to the SI.

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Using a highly sensitive atomic force microscope, researchers at TU Wien have shown that the unique geometry of the feldspar surface provides the perfect anchoring point for OH groups of hydrogen and oxygen -- and subsequently for water.

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To find out, TU researchers used a very sensitive atomic force microscope.

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Gerd Binnig shared the Kavli Prize in Nanoscience in 2016 for inventing the atomic force microscope.

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atomic force microscope

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